Science Lab

Science Lab

Science Lab

Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.
AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
Overview of Artificial Intelligence (AI) and Machine Learning

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
Automated wafer loader using carbon fiber end-effectors for safer handling.

Safe Wafer Loading for Microscope Inspection without Hand Contact

How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…
Eine Batterieelektrode, deren Ränder Grate aufweisen (mit roten Pfeilen markiert). Das Bild wurde mit einem Digitalmikroskop DVM6 aufgenommen.

Graterkennung während der Batterieherstellung

Erfahren Sie, wie die optische Mikroskopie zur Graterkennung an Batterieelektroden und zur Bestimmung des Schadenspotenzials eingesetzt werden kann, um eine schnelle und zuverlässige…
Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
Beckman Coulter LinkBeckman Coulter LogoGenedata LinkIDBS LogoIDBS LinkIDBS LogoAbcam Limited LinkAbcam Limited LogoMolecular Devices LinkMolecular Devices LogoPhenomenex LinkPhenomenex LogoSciex LinkSciex LogoAldevron LinkAldevron LogoIDT LinkIDT Logo
Scroll to top