
Science Lab
Science Lab
Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.
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A Guide to Using Microscopy for Drosophila (Fruit Fly) Research
The fruit fly, typically Drosophila melanogaster, has been used as a model organism for over a century. One reason is that many disease-related genes are shared between Drosophila and humans. It is…
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Investigación con Pez Cebra
Para obtener los mejores resultados en clasificación, selección, manipulación y captura y procesamiento de imágenes necesita ver los detalles y estructuras para poder tomar las decisiones adecuadas…
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Microscopios para disección
Las disecciones pueden implicar pasar horas mirando por los oculares de un microscopio para disección. Leica Microsystems le permite escoger entre una variada gama de microscopios y un amplio rango de…
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Depth of Field in Microscope Images
For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…
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Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy
The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
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6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
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Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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Burr Detection During Battery Manufacturing
See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.
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Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.