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Science Lab
Bienvenido al portal de conocimiento de Leica Microsystems. Aquí encontrará investigación científica y material didáctico sobre el tema de la microscopía. El portal ayuda a principiantes, profesionales experimentados y científicos por igual en su trabajo diario y en sus experimentos. Explore tutoriales interactivos y notas de aplicación, descubra los fundamentos de la microscopía, así como las tecnologías de gama alta. Forme parte de la comunidad Science Lab y comparta sus conocimientos.
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Ultramicrotome Sectioning of Polymers for TEM Analysis
We demonstrate the capabilities of the UC Enuity ultramicrotome from Leica Microsystems for preparing ultrathin sections of polymer samples under both ambient and cryogenic conditions. By presenting…
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Volume EM and AI Image Analysis
The article outlines a detailed workflow for studying biological tissues in three dimensions using volume-scanning electron microscopy (volume-SEM) combined with AI-assisted image analysis. The focus…
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Integrated Serial Sectioning and Cryo-EM Workflows for 3D Biological Imaging
This on-demand webinar explores how integrated tools can support electron microscopy workflows from sample preparation to image analysis. Experts Andreia Pinto, Adrian Boey, and Hoyin Lai present the…
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How Fluorescence Guides Sectioning of Resin-embedded EM Samples
Electron microscopes, including transmission electron microscopes (TEM) and scanning electron microscopes (SEM), are widely utilized to gain detailed structural information about biological samples or…
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How to Save Time and Samples by Automated Ultramicrotomy
This article describes how 3D micro-CT data of a resin-embedded electron microscopy sample can be used to trim the specimen down to a defined target plane prior to sectioning. The interactive and…
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Essential Guide to Ultramicrotomy
When studying samples, to visualize their fine structure with nanometer scale resolution, most often electron microscopy is used. There are 2 types: scanning electron microscopy (SEM) which images the…
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The Guide to STED Sample Preparation
This guide is intended to help users optimize sample preparation for stimulated emission depletion (STED) nanoscopy, specifically when using the STED microscope from Leica Microsystems. It gives an…
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Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries
Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
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Five Inverted-Microscope Advantages for Industrial Applications
With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…