Science Lab

Science Lab

Science Lab

Bienvenue sur le portail de connaissances de Leica Microsystems. Vous y trouverez des recherches scientifiques et du matériel didactique sur le thème de la microscopie. Le portail aide les débutants, les praticiens expérimentés et les scientifiques dans leur travail quotidien et leurs expériences. Explorez les didacticiels interactifs et les notes d'application, découvrez les bases de la microscopie ainsi que les technologies de pointe. Faites partie de la communauté Science Lab et partagez votre expertise.
A fruit fly (Drosophila melanogaster) observed with an Ivesta 3 stereo microscope during fly pushing (sorting of the flies). The scale bar length is 1 mm. Image courtesy of M. Benton, EMBL, Heidelberg, Germany.

A Guide to Using Microscopy for Drosophila (Fruit Fly) Research

The fruit fly, typically Drosophila melanogaster, has been used as a model organism for over a century. One reason is that many disease-related genes are shared between Drosophila and humans. It is…

A Guide to Zebrafish Research

To obtain optimal results while doing zebrafish research, especially during screening, sorting, handling, and imaging, seeing the fine details and structures is important. They help researchers make…
Pancreatic Ductal Adenocarcinoma with 11 Apoptosis biomarkers shown – BAK, BAX, BCL2, BCLXL, Caspase9, CIAP1, NaKATPase, PCK26, SMAC, Vimentin, and XIAP.

Transforming Research with Spatial Proteomics Workflows

Spatial Proteomics, Nature Methods 2024 Method of the Year, is driving research advancements in cancer, immunology, and beyond. By combining positional data with high throughput imaging of proteins in…
Ivesta 3 with integrated monitor.

Microscopes de dissection

Si vous devez procéder à des dissections, il peut vous arriver de rester penché sur les oculaires du microscope pendant des heures. Leica Microsystems vous propose de faire votre choix parmi un large…
Area of a printed circuit board (PCB) which was imaged with extended depth of field (EDOF) using digital microscopy.

Depth of Field in Microscope Images

For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…
Pancreatic Ductal Adenocarcinoma imaged with Cell DIVE. Analysis done by Aivia.

A Guide to Spatial Biology

What is spatial biology, and how can researchers leverage its tools to meet the growing demands of biological questions in the post-omics era? This article provides a brief overview of spatial biology…
Image of magnetic steel taken with a 100x objective using Kerr microscopy. The magnetic domains in the grains appear in the image with lighter and darker patterns. A few domains are marked with red arrows. Courtesy of Florian Lang-Melzian, Robert Bosch GmbH, Germany.

Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy

The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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