Science Lab

Science Lab

Science Lab

Bienvenue sur le portail de connaissances de Leica Microsystems. Vous y trouverez des recherches scientifiques et du matériel didactique sur le thème de la microscopie. Le portail aide les débutants, les praticiens expérimentés et les scientifiques dans leur travail quotidien et leurs expériences. Explorez les didacticiels interactifs et les notes d'application, découvrez les bases de la microscopie ainsi que les technologies de pointe. Faites partie de la communauté Science Lab et partagez votre expertise.
Particle analysis with the Visoria M microscope

AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module

The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…
AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…
Overview of Artificial Intelligence (AI) and Machine Learning

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…
Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…
Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…
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