Industrial Microscopy

Dive deep into detailed articles and webinars focusing on efficient inspection, optimized workflows, and ergonomic comfort in industrial and pathological contexts. Topics covered include quality control, materials analysis, microscopy in pathology, among many others. This is the place where you get valuable insights into using cutting-edge technologies for improving precision and efficiency in manufacturing processes as well as accurate pathological diagnosis and research.

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.

Automatic Alignment of Sample and Knife for High Sectioning Quality

Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.

Section ribbons with increasing section thickness - silver to purple ending in blue sections.

High Quality Sectioning in Ultramicrotomy

Discover the significance of achieving high-quality uniform sections with ultramicrotomy for precise imaging in electron microscopy.

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

This article describes cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

Micrograph of dinoflagellate cells. Scale bar = 1 µm.

How Marine Microorganism Analysis can be Improved with High-pressure Freezing

In this application example we showcase the use of EM-Sample preparation with high pressure freezing, freeze substiturion and ultramicrotomy for marine biology focusing on ultrastructural analysis of…

How to Prepare and Analyse Battery Samples with Electron Microscopy

This workshop covers the sample preparation process for lithium and novel battery sample analysis, as well as other semiconductor samples requiring high-resolution cross-section imaging.

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