Science Lab

Science Lab

Science Lab

Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.
A fruit fly (Drosophila melanogaster) observed with an Ivesta 3 stereo microscope during fly pushing (sorting of the flies). The scale bar length is 1 mm. Image courtesy of M. Benton, EMBL, Heidelberg, Germany.

A Guide to Using Microscopy for Drosophila (Fruit Fly) Research

The fruit fly, typically Drosophila melanogaster, has been used as a model organism for over a century. One reason is that many disease-related genes are shared between Drosophila and humans. It is…

Zebrafisch-Forschung

Für optimale Ergebnisse während der Bewertung, Sortierung, Manipulation und Bildgebung von Modellorganismen ist es entscheidend feine Details und Strukturen genauestens zu erkennen. Das bildet die…
Pancreatic Ductal Adenocarcinoma with 11 Apoptosis biomarkers shown – BAK, BAX, BCL2, BCLXL, Caspase9, CIAP1, NaKATPase, PCK26, SMAC, Vimentin, and XIAP.

Transforming Research with Spatial Proteomics Workflows

Spatial Proteomics, Nature Methods 2024 Method of the Year, is driving research advancements in cancer, immunology, and beyond. By combining positional data with high throughput imaging of proteins in…
Ivesta 3 with integrated monitor.

Präpariermikroskope

Wenn Sie Präparationen durchführen, verbringen Sie oft viele Stunden an den Okularen eines Präpariermikroskops. Bei Leica Microsystems können Sie aus einer Vielzahl von Mikroskopen und einem…
Area of a printed circuit board (PCB) which was imaged with extended depth of field (EDOF) using digital microscopy.

Depth of Field in Microscope Images

For microscopy imaging, depth of field is an important parameter when needing sharp images of sample areas with structures having significant changes in depth. In practice, depth of field is…
Pancreatic Ductal Adenocarcinoma imaged with Cell DIVE. Analysis done by Aivia.

Leitfaden zur Räumlichen Biologie

What is spatial biology, and how can researchers leverage its tools to meet the growing demands of biological questions in the post-omics era? This article provides a brief overview of spatial biology…
Image of magnetic steel taken with a 100x objective using Kerr microscopy. The magnetic domains in the grains appear in the image with lighter and darker patterns. A few domains are marked with red arrows. Courtesy of Florian Lang-Melzian, Robert Bosch GmbH, Germany.

Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy

The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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