
Science Lab
Science Lab
Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.
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Das Prinzip der Polarisationsmikroskopie
Die Polarisationsmikroskopie wird in den Material- und Geowissenschaften routinemäßig eingesetzt, um Materialien und Mineralien anhand ihrer charakteristischen Brechungseigenschaften und Farben zu…
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An Introduction to Laser Microdissection
The heterogeneity of histological and biological specimens often requires isolation of specific single cells or cell groups from surrounding tissue before molecular biology analysis can be carried…
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Molecular Biology Analysis facilitated with Laser Microdissection (LMD)
Extracting biomolecules, proteins, nucleic acids, lipids, and chromosomes, as well as extracting and manipulating cells and tissues with laser microdissection (LMD) enables insights to be gained into…
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Neuron Isolation in Spatial Context with Laser Microdissection (LMD)
After Alzheimer’s disease, Parkinson’s is the second most common progressive neurodegenerative disease. Before the first symptoms manifest, up to 70% of dopamine-releasing neurons in the mid-brain…
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6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
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Workflow Solutions for Sample Preparation Methods for Material Science
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
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Automatic Alignment of Sample and Knife for High Sectioning Quality
Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.
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Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
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Rapid Semiconductor Inspection with Microscope Contrast Methods
Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…