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Science Lab

Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.

C. elegans embedded in Lowicryl® HM20; pharynx showing red fluorescence (mCherry). The overview shows a front view onto the resin capsule formed by the bottom of a flow-through chamber of the EM AFS2. The capsule was pretrimmed manually. The blockface was trimmed automatically using the AutoTrim function of UC Enuity guided by fluorescence of the worm. Edge length of both squares in relation to the images is 250 µm.

How Fluorescence Guides Sectioning of Resin-embedded EM Samples

Electron microscopes, including transmission electron microscopes (TEM) and scanning electron microscopes (SEM), are widely utilized to gain detailed structural information about biological samples or…

C. elegans nematode embedded in Epon epoxy resin, contrasted with osmium tetroxide. The resin block was pretrimmed by hand. Scale bar: 500 µm.

How to Save Time and Samples by Automated Ultramicrotomy

This article describes how 3D micro-CT data of a resin-embedded electron microscopy sample can be used to trim the specimen down to a defined target plane prior to sectioning. The interactive and…

Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

EBSD-Korngrößenverteilung des Querschnitts eines Golddrahtes in einer Siliziummatrix aus dem Inneren einer CPU (Zentraleinheit eines Computers). Die Körner sind mit verschiedenen Farben hervorgehoben.

Hochwertige EBSD-Probenvorbereitung

Es wird eine zuverlässige und effiziente EBSD-Probenvorbereitung von „gemischten“ kristallografischen Materialien mit Ionenbreitstrahlfräsen beschrieben. Das beschriebene Verfahren erzeugt…

Advancing Cellular Ultrastructure Research

Freeze-fracture and freeze-etching are useful tools for studying flexible membrane-associated structures such as tight junctions or the enteric glycocalyx. Freeze-fracture and etching are two…

Ion Beam Milling Guide: Enhancing Surface Quality for High-Resolution Imaging and Analysis

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Brief Introduction to Surface Metrology

This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…

Studying the Microstructure of Natural Polymers in Fine Detail

The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…