Science Lab

Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…
EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

How to Prepare and Analyse Battery Samples with Electron Microscopy

This workshop covers the sample preparation process for lithium and novel battery sample analysis, as well as other semiconductor samples requiring high-resolution cross-section imaging.
SEM image of the full Li-NMC electrode sample, showing the two porous layers and the metal film at the center of the structure.

Cross Section Ion Beam Milling of Battery Components

Sample Preparation of Lithium battery systems requires high quality surface preparation to evaluate their internal structure and morphology. Due to the brittle materials involved, preparing pristine…

Ion Beam Milling Guide: Enhancing Surface Quality for High-Resolution Imaging and Analysis

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Workflows and Instrumentation for Cryo-electron Microscopy

Cryo-electron microscopy is an increasingly popular modality to study the structures of macromolecular complexes and has enabled numerous new insights in cell biology. In recent years, cryo-electron…

Studying the Microstructure of Natural Polymers in Fine Detail

The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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