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10
May
2026
金相分析在材料可靠性研究中的融合实践
China
•
Webinar
25
Jun
2026
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Practical Applications of Broad Ion Beam Milling
Mechanical polishing can be time consuming and frustrating. It can also introduce unwanted artifacts when preparing cross-sectioned samples for electron backscatter diffraction (EBSD) in the scanning…
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Digital Microscopy in Earth Science
Classical polarized light (compound) microscopes can only be used for prepared samples, because the working distance they offer is insufficient for whole samples. This means that thicker and bigger…