Science Lab

Science Lab

Science Lab

Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.

Automatic Alignment of Sample and Knife for High Sectioning Quality

Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…
Bild von immunfluoreszierend markierten Zellen, wobei Mitochondrien rot, Zellkerne blau und Aktin grün dargestellt sind.

Erforschung der Virusreplikaton mit Fluoreszenzmikroskopie

Viren können mit Hilfe verschiedener Mikroskopietechniken untersucht werden. Je nach Vergrößerung und Auflösung des Mikroskops kann die Beobachtung auf Gewebe-, Zell- oder Virionenebene erfolgen.
Fluorescence microscopy image of liver tissue where DNA in the nuclei are stained with Feulgen-pararosanilin and visualized with transmitted green light.

Epi-Illumination Fluorescence and Reflection-Contrast Microscopy

This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
Image of an onion flake taken with a basic Leica compound microscope after it was tested for resistance to fungus and mold growth following part 11 of the ISO 9022 standard.

ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions

This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.
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