Science Lab

Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。
C. elegans embedded in Lowicryl® HM20; pharynx showing red fluorescence (mCherry). The overview shows a front view onto the resin capsule formed by the bottom of a flow-through chamber of the EM AFS2. The capsule was pretrimmed manually. The blockface was trimmed automatically using the AutoTrim function of UC Enuity guided by fluorescence of the worm. Edge length of both squares in relation to the images is 250 µm.

How Fluorescence Guides Sectioning of Resin-embedded EM Samples

Electron microscopes, including transmission electron microscopes (TEM) and scanning electron microscopes (SEM), are widely utilized to gain detailed structural information about biological samples or…
C. elegans nematode embedded in Epon epoxy resin, contrasted with osmium tetroxide. The resin block was pretrimmed by hand. Scale bar: 500 µm.

How to Save Time and Samples by Automated Ultramicrotomy

This article describes how 3D micro-CT data of a resin-embedded electron microscopy sample can be used to trim the specimen down to a defined target plane prior to sectioning. The interactive and…
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
EBSD grain size distribution of the cross section of a gold wire within a silicon matrix from inside a CPU (central processing unit of a computer). The grains are highlighted with arbitrary colors.

High-Quality EBSD Sample Preparation

This article describes a method for EBSD sample preparation of challenging materials. The high-quality samples required for electron backscatter diffraction are prepared with broad ion-beam milling.

Advancing Cellular Ultrastructure Research

Freeze-fracture and freeze-etching are useful tools for studying flexible membrane-associated structures such as tight junctions or the enteric glycocalyx. Freeze-fracture and etching are two…

Ion Beam Milling Guide: Enhancing Surface Quality for High-Resolution Imaging and Analysis

In this article you can learn how to optimize the preparation quality of your samples by using the ion beam etching method with the EM TIC 3X ion beam milling machine. A short introduction of the…

Visual and Chemical Analysis of Steel Microstructure: Faster Rating of Steel Quality

Simultaneous visual and chemical analysis of steel non-metallic inclusions with a 2-methods-in-1 solution, using optical microscopy and laser induced breakdown spectroscopy (LIBS), is described in…

Brief Introduction to Surface Metrology

This report briefly discusses several important metrology techniques and standard definitions commonly used to assess the topography of surfaces, also known as surface texture or surface finish. With…

Studying the Microstructure of Natural Polymers in Fine Detail

The potential of cryogenic broad ion beam milling used in combination with scanning electron microscopy (cryo-BIB-SEM) for imaging and analyzing the microstructure of cryogenically stabilized soft…
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