Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。
Articles
Leitz Laborlux: Tartaric acids, polarization contrast

The Polarization Microscopy Principle

Polarization microscopy is routinely used in the material and earth sciences to identify materials and minerals on the basis of their characteristic refractive properties and colors. In biology,…
Image of a 12-μm thick brain section, which was stained with Toluidin blue, before dissection. It was taken with a microscope using a 63x objective.

An Introduction to Laser Microdissection

The heterogeneity of histological and biological specimens often requires isolation of specific single cells or cell groups from surrounding tissue before molecular biology analysis can be carried…
Mouse brain (left) microdissected with a 10x objective (upper right). Inspection of the collection device (lower right).

Molecular Biology Analysis facilitated with Laser Microdissection (LMD)

Extracting biomolecules, proteins, nucleic acids, lipids, and chromosomes, as well as extracting and manipulating cells and tissues with laser microdissection (LMD) enables insights to be gained into…
Image of murine dopaminergic neurons which have been marked for laser microdissection (LMD).

Neuron Isolation in Spatial Context with Laser Microdissection (LMD)

After Alzheimer’s disease, Parkinson’s is the second most common progressive neurodegenerative disease. Before the first symptoms manifest, up to 70% of dopamine-releasing neurons in the mid-brain…
Region of a patterned wafer inspected using optical microscopy and automated and reproducible DIC (differential interference contrast). With DIC users are able to visualize small height differences on the wafer surface more easily.

6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences

A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.
Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.

Automatic Alignment of Sample and Knife for High Sectioning Quality

Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
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