Science Lab | Leica Microsystems

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Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。

Workflow Solutions for Sample Preparation Methods for Material Science

This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science samples.

Camera image during auto alignment. The feedback lines indicate if the correct edges in the image are detected. Green: Vertical center line; Magenta: Upper edge of the light gap; White: Lower edge of the light gap (not visible here, falling together with red line); Red: Knife edge; Blue: Left and right edge of the block face being automatically detected.

Automatic Alignment of Sample and Knife for High Sectioning Quality

Automatic alignment of sample and knife on the ultramicrotome UC Enuity, enabling even untrained users to create ultrathin sections with reduced risk of losing precious sections.

Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.

Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…

Preparation of an IC-chip cross section require cutting of the chip followed by grinding and polishing of the cross section.

Quality Control via Cross Sections of PCBs, PCBAs, ICs, and Batteries

Why cross sections of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), and battery components are useful for quality control (QC), failure analysis (FA), and research…

Image of immunofluorescently labelled cells where mitochondria are indicated with red, nuclei with blue, and actin with green.

Studying Virus Replication with Fluorescence Microscopy

The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…

Fluorescence microscopy image of liver tissue where DNA in the nuclei are stained with Feulgen-pararosanilin and visualized with transmitted green light.

Epi-Illumination Fluorescence and Reflection-Contrast Microscopy

This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…

Material sample with a large height, size, and weight being observed with an inverted microscope.

Five Inverted-Microscope Advantages for Industrial Applications

With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…

Image of an onion flake taken with a basic Leica compound microscope after it was tested for resistance to fungus and mold growth following part 11 of the ISO 9022 standard.

ISO 9022 Standard Part 11 - Testing Microscopes with Severe Conditions

This article describes a test to determine the robustness of Leica microscopes to mold and fungus growth. The test follows the specifications of the ISO 9022 part 11 standard for optical instruments.