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Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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Rapid Check of Live Stem Cells in Cell-Culture Inserts set in Multi-Well Plates
See how efficient imaging of live iPSC stem cells within cell-culture inserts set in a multi-well plate can be done to evaluate the cells using a THUNDER Imager. Just read this article.
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Key Factors for Efficient Cleanliness Analysis
An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
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How to Get Deeper Insights into your Organoid and Spheroid Models
In this eBook, learn about key considerations for imaging 3D cultures, such as organoids and spheroids, and discover microscopy solutions to shed new insights into dynamic processes in 3D real-time
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Epi-Illumination Fluorescence and Reflection-Contrast Microscopy
This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
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Five Inverted-Microscope Advantages for Industrial Applications
With inverted microscopes, you look at samples from below since their optics are placed under the sample, with upright microscopes you look at samples from above. Traditionally, inverted microscopes…
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Exploring Subcellular Spatial Phenotypes with SPARCS
Discover spatially resolved CRISPR screening (SPARCS), a platform for microscopy-based genetic screening for spatial subcellular phenotypes at the human genome scale.
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Introduction to Fluorescent Proteins
Overview of fluorescent proteins (FPs) from, red (RFP) to green (GFP) and blue (BFP), with a table showing their relevant spectral characteristics.
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Structural and Chemical Analysis of IC-Chip Cross Sections
This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…