Science Lab

Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。
Staining is crucial to revealing details in the specimens.

H&E Staining in Microscopy

If we consider the role of microscopy in pathologists’ daily routines, we often think of the diagnosis. While microscopes indeed play a crucial role at this stage of the pathology lab workflow, they…
Type of contamination: spores

Cleanliness Analysis for Particulate Contamination

Devices, products, and their components fabricated in many industries can be quite sensitive to contamination and, as a result, have stringent requirements for technical cleanliness. Measurement…
Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…
A stack of lithium-ion batteries

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…
Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…
Acute lymphoblastic leukemia

How to Benefit from Digital Cytopathology

If you have thought of digital cytopathology as characterized by the digitization of glass slides, this webinar with Dr. Alessandro Caputo from the University Hospital of Salerno, Italy will broaden…
Electronic component

Top Challenges for Visual Inspection

This article discusses the challenges encountered when performing visual inspection and rework using a microscope. Using the right type of microscope and optical setup is paramount in order to…
Wafer

How to Boost your Microelectronic Component Inspection Performance

Do you need to see more when inspecting silicon wafers or MEMS? Would you like to get sharp and detailed sample images which are similar to those from electron microscopes? Watch this free webinar…
Sport Fabrics Taped I3 10x Color

How Industrial Applications Benefit from Fluorescence Microscopy

Watch this free webinar to know more about what you can do with fluorescence microscopy for industrial applications. We will cover a wide range of investigations where fluorescence contrast offers new…
Beckman Coulter LinkBeckman Coulter LogoGenedata LinkIDBS LogoIDBS LinkIDBS LogoAbcam Limited LinkAbcam Limited LogoMolecular Devices LinkMolecular Devices LogoPhenomenex LinkPhenomenex LogoSciex LinkSciex LogoAldevron LinkAldevron LogoIDT LinkIDT Logo
Scroll to top