Science Lab

Science Lab

Science Lab

ライカマイクロシステムズのナレッジポータルでは、顕微鏡の基礎から最先端技術まで、幅広い情報を提供しています。初心者から熟練者、研究者、医師の皆様まで、日々の研究や実験に役立つ内容となっております。チュートリアルやアプリケーションノートを活用し、学びながら探究心を刺激してください。さらに、コミュニティに参加することで、知見を共有し、新たな発見へとつなげましょう。お気軽に参加いただき、互いの専門知識を深め合う場としてご活用ください。
Particles observed on the surface of a particle trap which could be used for technical cleanliness during battery production.

Battery Particle Detection During the Production Process

How battery particle detection and analysis is enhanced with optical microscopy and laser spectroscopy for rapid, reliable, and cost-effective QC during battery production is explained in this…
THUNDER image of brain-capillary endothelial-like cells derived from human iPSCs (induced pluripotent stem cells) where cyan indicates nuclei and magenta tight junctions.

Rapid Check of Live Stem Cells in Cell-Culture Inserts set in Multi-Well Plates

See how efficient imaging of live iPSC stem cells within cell-culture inserts set in a multi-well plate can be done to evaluate the cells using a THUNDER Imager. Just read this article.

Accelerating Discovery for Multiplexed Imaging of Diverse Tissues

Explore IBEX: Open-source multiplexed imaging. Join the collaborative IBEX Imaging Community for optimized tissue processing, antibody selection, and human atlas construction.
Particulate contamination in between moving metal plates.

Key Factors for Efficient Cleanliness Analysis

An overview of the key factors necessary for technical cleanliness and efficient cleanliness analysis concerning automotive and electronics manufacturing and production is provided in this article.
Images of the same area of a processed wafer taken with standard (left) and oblique (right) brightfield illumination using a Leica compound microscope. The defect on the wafer surface is clearly more visible with oblique illumination.

Rapid Semiconductor Inspection with Microscope Contrast Methods

Semiconductor inspection during the production of patterned wafers and ICs (integrated circuits) is important for identifying and minimizing defects. To increase the efficiency of quality control in…
Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

How to perform cross-section analysis for Quality Control of PCBs, PCBAs, ICs and batteries

Cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc.
Image of immunofluorescently labelled cells where mitochondria are indicated with red, nuclei with blue, and actin with green.

Studying Virus Replication with Fluorescence Microscopy

The results from research on SARS-CoV-2 virus replication kinetics, adaption capabilities, and cytopathology in Vero E6 cells, done with the help of fluorescence microscopy, are described in this…
Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.
Fluorescence microscopy image of liver tissue where DNA in the nuclei are stained with Feulgen-pararosanilin and visualized with transmitted green light.

Epi-Illumination Fluorescence and Reflection-Contrast Microscopy

This article discusses the development of epi-illumination and reflection contrast for fluorescence microscopy concerning life-science applications. Much was done by the Ploem research group…
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