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Science Lab
Willkommen auf dem Wissensportal von Leica Microsystems. Hier finden Sie wissenschaftliches Forschungs- und Lehrmaterial rund um das Thema Mikroskopie. Das Portal unterstützt Anfänger, erfahrene Praktiker und Wissenschaftler gleichermaßen bei ihrer täglichen Arbeit und ihren Experimenten. Erkunden Sie interaktive Tutorials und Anwendungshinweise, entdecken Sie die Grundlagen der Mikroskopie ebenso wie High-End-Technologien. Werden Sie Teil der Science Lab Community und teilen Sie Ihr Fachwissen.
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How to Select the Right Measurement Microscope
With a measurement microscope, users can measure the size and dimensions of sample features in both 2D and 3D, something crucial for inspection, QC, failure analysis, and R&D. However, choosing the…
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Microscope Calibration for Measurements: Why and How You Should Do It
Microscope calibration ensures accurate and consistent measurements for inspection, quality control (QC), failure analysis, and research and development (R&D). Calibration steps are described in this…
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Ophthalmology Case Study: Corneal Transplantation
Learn about the use of intraoperative Optical Coherence Tomography in Corneal Transplantation and how it helps achieve correct positioning of donor tissue.
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Visualizing Photoresist Residue and Organic Contamination on Wafers
As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…
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Rapidly Visualizing Magnetic Domains in Steel with Kerr Microscopy
The rotation of polarized light after interaction with magnetic domains in a material, known as the Kerr effect, enables the investigation of magnetized samples with Kerr microscopy. It allows rapid…
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6-Inch Wafer Inspection Microscope for Reliably Observing Small Height Differences
A 6-inch wafer inspection microscope with automated and reproducible DIC (differential interference contrast) imaging, no matter the skill level of users, is described in this article. Manufacturing…
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Glaucoma Stent Revision Surgery Guided by Intraoperative OCT
Learn about a glaucoma subconjunctival stent revision guided by intraoperative OCT and the important role it plays to ensure the best outcome.
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Safe Wafer Loading for Microscope Inspection without Hand Contact
How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…
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Graterkennung während der Batterieherstellung
Erfahren Sie, wie die optische Mikroskopie zur Graterkennung an Batterieelektroden und zur Bestimmung des Schadenspotenzials eingesetzt werden kann, um eine schnelle und zuverlässige…