Science Lab

The knowledge portal of Leica Microsystems offers scientific research and teaching material on the subjects of microscopy. The content is designed to support beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies – become part of the Science Lab community and share your expertise!

Preparation of an IC-chip cross section: grinding and polishing of the chip cross section.

Cross-section Analysis for Electronics Manufacturing

Cross-section analysis for electronics concerning quality control and failure analysis of printed circuit boards (PCBs) and assemblies (PCBAs), integrated circuits (ICs), etc. are described in this…

Image of an integrated-circuit (IC) chip cross section acquired at higher magnification showing a region of interest.

Structural and Chemical Analysis of IC-Chip Cross Sections

This article shows how electronic IC-chip cross sections can be efficiently and reliably prepared and then analyzed, both visually and chemically at the microscale, with the EM TXP and DM6 M LIBS…

Differential Interference Contrast (DIC) Microscopy

This article demonstrates how differential interference contrast (DIC) can be actually better than brightfield illumination when using microscopy to image unstained biological specimens.

User analyzing particles and fibers on a filter for cleanliness analysis with the DM6 M LIBS 2-methods-in-1 solution.

Basics in Component Cleanliness Analysis

An overview on the basics of component cleanliness and analysis solutions that can be tailored to your specific needs is presented. For the automotive industry, obtaining results rapidly, accurately,…

The various solutions from Leica Microsystems for cleanliness analysis.

Factors to Consider for a Cleanliness Analysis Solution

Choosing the right cleanliness analysis solution is important for optimal quality control. This article discusses the important factors that should be taken into account to find the solution that best…

Particles and fibers on a filter which will be counted and analyzed for cleanliness

Efficient Particle Counting and Analysis

This report discusses particle counting and analysis using optical microscopy for cleanliness of parts and components. Particle counting and analysis is a critical part of quality assurance in the…

Quality Control Under the Microscope

Fast-rising demand for electric vehicles is one of the market’s main drivers, but there are other hotspots of growth, including the rise in renewable energy installations, such as photovoltaic panels,…

Particles which could be found during cleanliness analysis of parts and components.

Cleanliness of Automotive Components and Parts

This article discusses the ISO 16232 standard and VDA 19 guidelines and briefly summarizes the particle analysis methods. They give important criteria for the cleanliness of automotive parts and…

Multiple particles seen on a filter imaged with a microscope

Improving the Cleanliness Analysis Workflow

For automotive manufacturers and automotive component suppliers, obtaining cleanliness results rapidly, accurately, and reliably over the entire workﬂow is a signiﬁcant advantage. Often for this…