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Workflow Solutions for Industrial Research
This brochure presents and explains appropriate workflow solutions for the most frequently required sample preparation methods for material science…
Apr 28, 2020Story - Loading...
Contrast Enhancement of Polycrystalline Metals - Sample Preparation for SEM
Application Note - Ion milling is a perfect alternative for chemical etching, especially for polycrystalline metals, such as copper. Ion milling can…
Feb 01, 2017Story - Loading...
Porous Ceramics - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ceramic membrane filters with pore sizes down to a few nanometres must be investigated in cross-section with…
Jan 17, 2017Story - Loading...
Removal of Surface Layers - Sample Preparation for SEM and TEM
Application Note for Leica EM RES102 - Sometimes it is necessary to remove surface layers to gain access to the real surface structure. That can be a…
Jan 11, 2017Story - Loading...
Multilayer Systems with Widely Different Sputter Rates - Sample Preparation for TEM
Application Note for Leica EM RES102 - The multi-layer system to be prepared in cross-section consists of a Si substrate, a TiN layer with a thickness…
Dec 16, 2016Story - Loading...
![High resolution XTEM lattice [110] image of conventional prepared InP](/fileadmin/_processed_/b/b/csm_Compound_3_f7523e2740.jpg "In-Containing Compound Semiconductors - Sample Preparation for TEM")
In-Containing Compound Semiconductors - Sample Preparation for TEM
Application Note for Leica EM RES102 - Previous studies showed that surface accumulation of In occurs when InP was milled in a conventional way with…
Dec 12, 2016Story - Loading...
"Shallow Trench Isolation" Structures - Sample Preparation for TEM
Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical…
Nov 18, 2016Story - Loading...
Paper Samples - Sample Preparation for SEM
Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard…
Nov 16, 2016Story - Loading...
Contrast Enhancement of Polished Cross Sections of Semiconductor Structures - Sample Preparation for SEM
Application Note for Leica EM RES102 - The surfaces of polished cross sections often show fine scratches and residues of the removed material or of…
Oct 28, 2016Story - Loading...
Surface Modification of ZnAg Sample - Sample Preparation for SEM
Application Note for Leica EM RES102 - By means of cleaning, polishing and contrast enhancement a soft ZnAg sample should be prepared to obtain…
Oct 17, 2016Story - Loading...
Thin Metal Foils with Coatings - Sample Preparation for SEM
Application Note for Leica EM RES102 - Thin foils are mostly unstable because of their thickness of a few microns. This makes it difficult to do slope…
Oct 05, 2016Story - Loading...
Ion Beam Polishing of Sample Surfaces - Sample Preparation for SEM
Application Note for Leica EM RES102 - Ion milling can be used to reduce the roughness of sample surfaces. Small angles less than 6° with respect to…
Sep 06, 2016Story - Loading...
Cleaning of Smeared Sample Surfaces - Sample Preparation for SEM
Application Note for Leica EM RES102 - Mechanical polishing of soft materials or hard / soft material combinations is tricky. The mechanical polishing…
Sep 02, 2016Story - Loading...
Ceramics - Sample Preparation for TEM
Application Note for Leica EM RES102 - Ceramic samples are mostly very brittle, and are therefore very difficult to thin mechanically to a low…
Aug 15, 2016Story - Loading...
TEM Sample Preparation Made Easy - Prepare TEM Specimen by Broad Beam Argon Ion Milling
Quantitative and analytical analysis at high spatial resolution places stringent demands on the quality of the produced TEM specimens. Pristine and…
Dec 15, 2015Abstract