Sample Preparation
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Multilayer Systems with Widely Different Sputter Rates - Sample Preparation for TEM
Application Note for Leica EM RES102 - The multi-layer system to be prepared in cross-section consists of a Si substrate, a TiN layer with a thickness of a few nm and a 500 nm W layer. All these…Read article![High resolution XTEM lattice [110] image of conventional prepared InP](https://webcdn.leica-microsystems.com/fileadmin/_processed_/b/b/csm_Compound_3_525d192774.jpg "In-Containing Compound Semiconductors - Sample Preparation for TEM")
In-Containing Compound Semiconductors - Sample Preparation for TEM
Application Note for Leica EM RES102 - Previous studies showed that surface accumulation of In occurs when InP was milled in a conventional way with Ar ions. The consequence is In islands on the…Read article
Carbon Coating for Polymeric Materials
Application Note fo Leica EM ACE600 - A solid understanding of polymer property-structure relationships is critical to improve and shorten development routes to new products. A direct way to determine…Read article
High-Resolution Carbon Coating: How much Carbon is too much?
Application Note for Leica EM ACE600 - Carbon support films are routinely used for high resolution TEM. Thickness is one of the main criteria to assess its usefulness for a particular experiment.…Read article
Each Atom Counts: Protect Your Samples Prior to FIB Processing
Application Note for Leica EM ACE600 - Focused ion beam (FIB) technology has become an indispensable tool for site-specific TEM sample preparation. It allows to extract electron transparent specimens…Read article
Commercially Available Hand Creams - Sample Preparation for Cryo-SEM
Application Note for Leica EM HPM100 - Hand creams having different water contents were applied into the 100 μm cavities of two 3 mm type A sample carriers which were then closed cream sides inwards.…Read article
"Shallow Trench Isolation" Structures - Sample Preparation for TEM
Application Note for Leica EM RES102 - The cross-sectional preparation of structured semiconductor materials requires a very thorough mechanical pre-preparation. In doing this, it must be ensured that…Read article
Tobacco Leaf - Critical Point Drying Protocol for SEM
Application Note for Leica EM CPD300 - Critical point drying of tobacco leafs with subsequent platinum coating and SEM analysis.Read article
Paper Samples - Sample Preparation for SEM
Application Note for Leica EM RES102 - A coated paper sample has been prepared with ion beam slope cutting in order to test the procedure with regard to its applicability. With the use of ion beam…Read article
Metal Films and Sheets - Sample Preparation for TEM
Application Note for Leica EM RES102 - Most metal films already have a thickness that requires no further mechanical pre-preparation. Frequently, however, they are also domed, which can lead to…Read article
Nematode E. dianae - Critical Point Drying Protocol for SEM
Application Note for Leica EM CPD300 - Critical point drying of nematode Eubostrichus dianae to detect the ectosymbiotic bacteria layer with subsequent gold coating ans SEM analysis.Read article
Visualization of Membrane Dynamics with Millisecond Temporal Resolution
Application Note for Leica EM ICE, Leica EM AFS2 - Electrical stimulation of neurons combined with high-pressure freezing allows physiological activation of synaptic activity and precise control over…Read article
Contrast Enhancement of Polished Cross Sections of Semiconductor Structures - Sample Preparation for SEM
Application Note for Leica EM RES102 - The surfaces of polished cross sections often show fine scratches and residues of the removed material or of the abrasive material. The artefacts are strongly…Read article
Practical Guide for Excellent GSDIM Super-Resolution Images
Do you know that most protists and bacteria lack in one feature that each of our body cell has? Our cells are touch and communicate with one another. They send and receive a variety of signals that…Read article
Wall Cress Pod Protocol - Critical Point Drying of Arabidopsis thaliana for SEM
Application Note for Leica EM CPD300 - Critical point drying of wall cress (Arabidopsis thaliana) pod with subsequent gold coating and SEM analysis.Read article