Sample Preparation
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Surface Modification of ZnAg Sample - Sample Preparation for SEM
Application Note for Leica EM RES102 - By means of cleaning, polishing and contrast enhancement a soft ZnAg sample should be prepared to obtain information concerning the grain structure and…Read article
Cross Sectioning of Ni/Cu on Steel for EBSD
Application Note for Leica EM TIC 3X - Electron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping,…Read article
Bacteria Protocol - Critical Point Drying of E. coli for SEM
Application Note for Leica EM CPD300 - Critical point drying of E. coli with subsequent platinum / palladium coating and SEM analysis. Sample was inserted into a filter disc (Pore size: 16 - 40 μm)…Read article
Cross Sectioning of Painted Concrete
Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve flat cuts of material combinations consisting of hard and soft materials. Here, cross sectioning of painted…Read article
Clawed Frog Nuclear Envelope Protocol
Application Note for Leica EM CPD300 - Critical point drying of nuclear pores from clawed frog oocytes with subsequent chromium coating and SEM analysis. Silicon chips containing the samples were…Read article
Micro-Computed Tomography (micro-CT) of Insect Brain Protocol
Application Note for Leica EM CPD300 - Critical point drying of the blow fly with subsequent X-ray micro-computed tomography (micro-CT) to detect neuroanatomical features.Read article
Thin Metal Foils with Coatings - Sample Preparation for SEM
Application Note for Leica EM RES102 - Thin foils are mostly unstable because of their thickness of a few microns. This makes it difficult to do slope cutting without any protection of the sample. A…Read article
Ultra-thin Carbon Support Films for Improved STEM-EELS Analysis of Nanoparticles
Application Note for Leica EM ACE600 - Recent developments in aberration corrected transmission electron microscopes as well as further improvements in monochromaters and spectrometers have pushed the…Read article
Ways to Reveal More from your Samples: Ultra-Thin Carbon Films
Application Note for Leica EM ACE600 - Much of the battle involved in obtaining good transmission electron microscopy data is in the specimen preparation itself. Even though some nanomaterials are…Read article
Measuring the 3D STED-PSF with a new Type of Fluorescent Beads
A new type of fluorescent bead is presented by GATTAquant. These beads, called GATTA-Beads, are characterized by a small diameter (23 nm), high intensity and size uniformity. In combination with…Read article
Cross Sectioning of a Superconductive Wire
Application Note for Leica EM TIC 3X - Purpose: The shape of the wire is difficult for ion beam slope cutting. Goal: Cross sectional preparation to see the structure of the wire.Read article
Work Efficiently in Developmental Biology with Stereo and Confocal Microscopy: C. elegans
For scientists, technicians, and teachers working with the worm C. elegans in the research lab or classroom, this report is intended to give useful information to help improve their daly work. The aim…Read article
Structural Study of C. elegans
Application Note for Leica EM ICE, Leica EM AFS2 - Wildtype L4 stage C. elegans (N2 strain) were placed in the 100 μm deep side of Lecithin-coated (see detailed protocol*) type A 3 mm Cu/Au carriers…Read article
Cross Section of an Aluminium Sample for Electron Backscattered Diffraction (EBSD)
Application Note for Leica EM TIC020, Leica EM TIC 3X - Electron backscattered diffraction (EBSD) is for example used to examine the crystallographic orientation of material. The sample preparation…Read article
Freeze-Fracture Replication of Pyramidal Cells
Application Note for Leica EM HPM100 - Frozen samples (90 μm thick slices frozen by HPM100) were inserted into a double replica table and then fractured into two pieces at –130°C (after insertion of…Read article