AFM
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Automated topographic analysis with the Leica Map software
Watch this video to learn how you can save time when doing topographic analysis using the Leica Map software. The software allows you to go quickly from automated analysis of multiple sets of acquired…Read article
Abstracts of the 6th European Super-Resolution User-Club Meeting
The 6th European Super-Resolution User Club Meeting was held in collaboration with Dr. Timo Zimmermann, CRG, and Dr. Pablo Loza-Alvarez, ICFO, Barcelona. According to the founding principle of the…Read article
Translation Microscopy (TRAM) for Super-Resolution Imaging
Super-resolution microscopy is transforming our understanding of biology but accessibility is limited by its technical complexity, high costs and the requirement for bespoke sample preparation. We…Read article
Cross Sectioning of Rubber (Tire)
Application Note for Leica EM TIC 3X - Ion beam slope cutting is a method that can achieve cross sections of soft materials or material combinations consisting of hard and soft components.Read article
An Innovative Non-contact Method to Determine Surface Free Energy on Micro-areas
Surface free energy (SFE) is a property which depends on the chemical state and roughness of the surface and it is necessary to develop a reliable method to evaluate SFE value on a small area, taking…Read article
Biological Electron Microscopy
The Electron Microscopy (EM) laboratory in the School of Biological and Biomedical Sciences at Durham University is an integral part of a wider facility spanning a range of advanced imaging tools…Read article
Atomic Force Microscopy Study of a Stretched Impact Copolymer
Atomic force microscopy (AFM) is a powerful tool in the suite of nanoscale characterization techniques that provides a variety of information including topography, mechanical properties, and…Read article