Science Lab

Learn. Share. Contribute. The knowledge portal of Leica Microsystems. Find scientific research and teaching material on the subject of microscopy. The portal supports beginners, experienced practitioners and scientists alike in their everyday work and experiments. Explore interactive tutorials and application notes, discover the basics of microscopy as well as high-end technologies. Become part of the Science Lab community and share your expertise.

AI-based inspection detects, classifies, and measures defects directly in microscope images of components.

AI Image Analysis for Reliable Defect Detection

AI-based visual inspection with microscopy helps make quality control in industrial environments efficient by reducing manual inspection effort concerning defect detection, classification, and…

An Overview of Artificial Intelligence (AI) and Machine Learning

AI is rapidly changing industrial inspection, quality control, and manufacturing workflows. But not all AI technologies work the same way. From machine learning and deep learning to the newer concept…

Why the Future of Microscopic Inspection Is AI-Assisted, Not Fully Automated

The next wave of QC productivity gains will not come from building more automated inspection lines. Instead, it will come from augmenting millions of inspection decisions that are made manually every…

Particle analysis with the Visoria M microscope

AI-Based Particle Counting with the Aivaro AI Feature Detection Software Module

The Aivaro AI Feature Detection software module enables fast manual microscope inspection of particulate contamination on various material samples. By training different classes, reflective particles,…

Optical microscope image, which is a composition of both brightfield and fluorescence illumination, showing organic contamination on a wafer surface. The inset images in the upper left corner show the brightfield image (above) and fluorescence image (below with dark background).

Visualizing Photoresist Residue and Organic Contamination on Wafers

As the scale of integrated circuits (ICs) on semiconductors passes below 10 nm, efficient detection of organic contamination, like photoresist residue, and defects during wafer inspection is becoming…

Safe Wafer Loading for Microscope Inspection without Hand Contact

How automated silicon wafer loading for microscope inspection helps improve microelectronics process control and production efficiency is explained in this article. Manual handling of wafers has a…

Image of burrs (red arrows) at the edge of a battery electrode acquired with a DVM6 digital microscope.

Burr Detection During Battery Manufacturing

See how optical microscopy can be used for burr detection on battery electrodes and determination of damage potential to achieve rapid and reliable quality control during battery manufacturing.

Quality assurance during production in a manufacturing plant.

Quality Assurance Improvement Across Industries

Precision is paramount. Imagine a pacemaker that fails mid-operation or a semiconductor flaw that causes a critical system crash. In industries, such as medical devices, electronics, and…

Image of a Siemens star, where the diameter of the 1st black line circle is 10 mm and the 2nd is 20 mm, taken via an eyepiece of a M205 A stereo microscope. The rectangles represent the field of view (FOV) of a Leica digital camera when installed with various C-mounts (red 0.32x, blue 0.5x, green 0.63x).

Understanding Clearly the Magnification of Microscopy

To help users better understand the magnification of microscopy and how to determine the useful range of magnification values for digital microscopes, this article provides helpful guidelines.